Elsevier Materials Today Webinar: AFM-IR: nanoscale IR spectroscopy for Materials and Life Sciences
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Atomic force microscopy (AFM) and infra-red (IR) spectroscopy are complementary techniques in the structural and compositional investigation of a wide range of soft and hard materials. AFM is known to provide high-resolution characterization of local topographic, mechanical, and thermal properties. IR spectroscopy provides robust techniques for performing chemical analysis by analyzing the spectrum of IR light absorbed...
Anasys Instruments designs breakthrough, award-winning products that provide nanoscale probe based analytical techniques while providing high quality AFM imaging. We introduced the nano-TA in 2006 which launched the field of nanoscale thermal property measurement. In 2010, Anasys introduced the nanoIR Platform which developed the field of nanoscale IR measurement. In 2012, Anasys is proud to introduce Lorentz Contact Resonance which pioneers the field of wideband nanoscale dynamic mechanical spectroscopy.
Anasys Instruments is proud to introduce nanoIR2™, the second generation of our nanoscale IR spectroscopy platform. The breakthrough nanoIR2 system features top-side illumination which greatly expands the range of samples that can be studied. It combines the nanoscale spatial resolution capabilities of atomic force microscopy (AFM) with infrared spectroscopy’s ability to characterize and identify chemical species. It is an easy to use and powerful multifunctional platform with a full-featured AFM and nanoscale thermal & mechanical analysis.
Since its founding in 2005, Anasys Instruments has developed and introduced multiple major award-winning technologies: nanoscale thermal analysis (nano-TA™), transition temperature microscopy (TTM™), AFM+ thermal analysis (afm+™), and AFM+ IR Spectroscopy (nanoIR™). The afm+ was a 2007/2008 R&D 100 Award winner, and the nanoIR won the honor in 2010 as well as a Microscopy Today Innovation Award.
Anasys Instruments is a manufacturer of afm-atomic force microscopes, thermal scanning microscopy and nanoscale IR-infrared metrology equipment. We provide thermal analysis solutions and surface finish-roughness nano measurement tools for the biology, chemical, medical, semi-conductor industries among others. We also make patented ThermaLever™ probes and heated afm tips. Ask our company for a price-cost quote here.