| New!! Transition Temperature Microscopy (TTM) on the VESTA |
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Anasys Instruments is proud to announce Transition Temperature Microscopy (TTM) a new automated, point and click capability of the VESTA. Shown above is an example where TTM was used to identify the ring-like artifact in the Fiber reinforced system. The optical microscopy image revealed a skin around microfibers which was an artifact that formed during the microfiber embedding process, but the optical image could not identify the artifact. The TTM image determined that it was the use of 'aged' epoxy resin monomer and catalyst that had hydrolyzed during storage which led to the formation of a micron-thick skin with a higher transition temperature than the matrix or microfiber. Click here for more details.
Reveal micro and nanoscale inhomogeneities that cannot be seen with any other thermal technique.
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Transition Temperature Microscopy (patent pending) enables you to image microscopic variations in thermal transition temperatures on the surface of a sample, allowing measurements of thermal properties on scales invisible to conventional bulk analysis. Available on the award winning VESTA, TTM allows a user to define a region on a video optical image and then automatically perform an array of transition temperature measurements.
Applications: Transition Temperature Microscopy can be used in a wide variety of applications in Polymers; Pharmaceuticals; Thin Films/Coatings; Data Storage and Semiconductors. Here are a few examples:
- Map thermal inhomogeneities on surfaces at the microscale
- Measure thermal gradients in thin films and multi-layers
- Identify defects / contaminants with in-situ failure analysis
- Visualize the variation of crystallinity across your sample
- Characterize interface properties between two solid phases
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