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Elsevier Materials Today Webinar: AFM-IR: nanoscale IR spectroscopy for Materials and Life Sciences

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Atomic force microscopy (AFM) and infra-red (IR) spectroscopy are complementary techniques in the structural and compositional investigation of a wide range of soft and hard materials. AFM is known to provide high-resolution characterization of local topographic, mechanical, and thermal properties. IR spectroscopy provides robust techniques for performing chemical analysis by analyzing the spectrum of IR light absorbed...




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