COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Technology     nanoIR     FAQ-nanoIR     nano-TA     HT-AFM Heated Tip - AFM (HT-AFM) PS/PP Blend, 3 um x 1.5 um Scan, tip heated up to 250º C and back to room temperature With our HT-AFM mode, you can use your favorite AFM imaging modes with our proprietary thermal probes that enable you to get thermal information simultaneously with the other information that you get from normal AFM operation. The HT-AFM technique can be used in conjunction with the following AFM modes: Tapping Contact Imaging Force Curves Force Volume Imaging Pulsed Force Mode As you can see the applicability is vast. Our collaborators have recently applied this technique to Energetic Materials and to Membrane Nanocomposites Please contact us to see how you can apply this technique to your application.    © 2010 Anasys Instruments Corporation. All rights reserved.