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2D materials and nano-photonics

The nanoIR2-s™ combines two complementary techniques, AFM-IR and s-SNOM providing a platform for complete nanoscale FTIR spectroscopy, and nano-optical imaging that combine with chemical, structural and mechanical property mapping of a broad range of novel 2D and quantum materials.
nanoIR2-s


hBN phonon-polaritons
hBN-Phonon-polaritons-2

Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image showing homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude showing strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase showing a difference phase with alternating layer thicknesses. Images (b) and (c) show the changing wavelengths of the SPhP across the layers.

Graphene plasmonics
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).


s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. 3D view phase image (left), s-SNOM phase image (center) with a line cross-section of the SPP standing wave, and s-SNOM amplitude image (right).



Surface plasmon polaritons using visible illumination
Surface plasmon polaritons using visible illumination showing AFM topography and phase detailing Au rhombic dodecahedral lattices and the corresponding SNOM phase signal showing surface plasmons polaritrons propagating through the surface

s-SNOM imaging showing propagating surface plasmon polaritons along a sheet of gold rhombic dodecahedral lattices, with corresponding AFM topography & phase detailing gold rhombic dodecahedral lattices.

Nanoantennas
S-SNOM measurement of enhancement/scattering from resonant nanostructures. Topography left and SNOM phase center

s-SNOM measurement of enhancement/scattering from resonant nanostructures. Topography (left), SNOM phase (center), and 3D topography images with color overlay from SNOM phase (right).



Organolead triiodide perovskites

AFM-IR spectra and images of a solution-processed CH3NH3PbI3 photodetector collected as deposited (c,d) and after annealing at 140° C (e,f). Height images (top row) and corresponding AFM-IR images (bottom row). Images courtesy of Dong, R., Fang, et al, (2015), Adv. Mater., 27: 1912–1918

s-SNOM imaging and complex optical property spectroscopy
SNOM amplitude and phase for sample name. Using model fitting the complex optical properties can be obtained . The results show good agreement to ellipsometry

s-SNOM imaging has similarities to ellipsometry data, and collects intricate optical properties. Above: s-SNOM amplitude and phase spectra obtained for carbonyl resonance on PMMA.






"The nanoIR2-s is the perfect tool for users from both Soft Matter and Hard Matter research."
Dr. Ferenc Borondics
Principal Beamline Scientist at the
IR spectromicroscopy beamline, Soleil Synchrotron
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