COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Products     nanoIR     nano-TA2     SThM     VESTA     Probes nano-TA2™: Please click here for a Data Sheet (PDF format). This is the second generation from our nano-TA family and and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to: Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study. Heat a local area of less than 100nm diameter with the probe to temperatures of over 500 C to study thermal properties such as glass transition or melting point. Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches. Image with a heated tip to induce local thermal events over specific regions of a surface. Map the temperatures across the sample with a resolution of <0.1 ºC Click here for more information    © 2010 Anasys Instruments Corporation. All rights reserved.