COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Applications     Polymers     Pharmaceuticals Polymer Applications. Application Notes nano-TA: Identification of particle in Polymer film (pdf format) Analyzing nanoscale inclusions in a Polymer Matrix (pdf format) Multilayer Biaxially Oriented Polypropylene (BOPP) Films (pdf) Heated Tip-AFM of Energetic Materials (pdf format) Heated Tip-AFM of Membrane Nanocomposites (pdf format) Raman Spectroscopy resolution limits overcome by nano-TA in a Polymer Blend Characterization (pdf format) Blend Morphology of nanoscale Thin Films (pdf format) Nanoscale Thermal Analysis of Automobile Coatings (pdf format) Correlation of Nanoscale to Bulk Thermal Analysis (pdf format) Structure-Property Correlation of Bio-nanocomposites (pdf format) micro-TA: The following application notes are based on results obtained with the larger Wollaston probe (approx. 5μm tip diameter) and an older version of our instrument. We no longer supply this probe except under special circumstances. Please contact us if any of these applications interests you. Characterization of a Packaging Film by Micro-Thermal Analysis Characterisation of a Welded Polymer Joint by Micro-Thermal Analysis Characterization of Printing on a Polymer Film by Micro-Thermal Analyis Characterization of a Metal Coating on a Polymer Film by Micro-Therma Analysis Characterization of LEDs by Micro-Thermal Analysis Characterization of a Fiber Composite by Micro-Thermal Analysis Characterization of Leaf Wax by Micro-Thermal Analysis Characterization of an Elastic Film by Micro-Thermal Analyis and Evolved gas Analysis Characterization of a Paint Film by Micro-Thermal Analysis and Evolved gas Analysis Characterization of a Polymer Mixture by Micro-Thermal Analysis and Evolved Gas Analysis Characterization of a Polymer Blend by Variable Temperature Pulsed Force Mode AFM Characterization of a Phase-Separated Copolymer by Variable Temperature Pulsed Force AFM Publications a. Peer-reviewed Journals: Iverson, B., Blendell, J., Garimella, S., "Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance" 2010 Review of Scientific Instruments 81 03611 Germinario L.T, Schoff C.K, Kjoller K., Prater, C.P, Sahagian, K., "Transition Temperature Microscopy: A new technique for probing thermal properties of Coatings and Multi-layer Films at the micro and nanoscale", Journal of Coatings Technology, accepted for publication. Kulkarni H.P, Mogilevsky G., Mullins W.M., Wu Y., "Mechanism of aging effect on viscoelasticity in ethylene-methacrylic acid ionomer studied by local thermal-mechanical analysis", Journal of Materials Research, Vol. 24, No. 3, Mar 2009 Zhou J., Berry B., Douglas J.F., Karim A., Snyder C.R, and Soles C., "Nanoscale thermal-mechanical probe determination of 'softening transitions' in thin polymer films" 2008 Nanotechnology 19 495703 (9pp) Abel, M. R., T. L. Wright, S. Graham, and W. P. King. "Thermal Metrology of Silicon Microstructures using Raman Microscopy," IEEE Transactions on Components and Packaging Technology, 2007. Gray, T., Killgore, J., Luo, J., Jen, A., Overney, R.,” Molecular mobility and transitions in complex organic systems studied by shear force microscopy” Nanotechnology 18, 044009 (2007). Chui, B. W., L. Aeschimann, T. Akiyama, U. Staufer, N.F. DeRooij, J. Lee, F. Goericke, W. P. King, and P. Vettiger. "“Advanced Temperature Compensation for Piezoresistive Cantilevers using 45-Degree Angle Resistor Pairs," Review of Scientific Instruments, 2007. Gurrum, S. P., Y. K. Joshi, W. P. King, K. Ramakrishna, and M. Gall. "A Compact Approach to On-Chip Interconnect Heat Conduction Modeling Using the Finite Element Method," ASME Journal of Electronic Packaging, 2007. Harding, L., W. P. King, D. Q. M. Craig, and M. Reading. "Nanoscale Imaging of Partially Amorphous Materials using Local Thermomechanical Analysis and Heated Tip Pulsed Force Mode AFM," Pharmaceuticals Research (in press), 2007. Kim, K. J., K. Park, J. Lee, Z. M. Zhang, and W. P. King. "Nanotopographical Imaging using a Heated Atomic Force Microscope Cantilever Probe," Sensors and Actuators, 2007. King, W. P. and K. E. Goodson. "Thermomechanical Formation of Nanoscale Polymer Indents with a Heated Silicon Tip," Journal of Heat Transfer, 2007. Nelson, B. A. and W. P. King. "Thermal Analysis with Nanoscale Spatial Resolution using Heated Probe Tips," Review of Scientific Instruments (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 15, 2007), 78, 23702, 2007. Nelson, B. A., and W. P. King. "Temperature Calibration of Heated Silicon Atomic Force Microscope Cantilevers," Sensors and Actuators A, 2007. Park, K., J. Lee, Z. M. Zhang, and W. P. King. "Frequency-Dependant Electrical and Thermal Response of Heated Microcantilevers," Journal of Microelectromechanical Systems, 2007. Park, K., J. Lee, Z. M. Zhang, and W. P. King. "Topography Imaging using a Heated Atomic Force Microscope Cantilever in Tapping Mode," Review of Scientific Instruments, 2007. Park, K., S. Basu, W.P. King, and Z.M. Zhang. "Performance Analysis of Near-Field Thermophotovoltaic Devices Considering Absorption Distribution," Journal of Quantitative Spectroscopy and Radiative Transfer (in press), 2007. Remmert, J. L., Y. Wu, M. A. Shannon, and W. P. King. "Contact Potential Measurement using a Heated Atomic Force Microscope Cantilever Tip," Applied Physics Letters (in press), 2007. Rowland, H. D., A. C. Sun, P. R. Schunk, G. L. W. Cross, and W. P. King. "Predicting Polymer Flow during High Temperature Atomic Force Microscope Nanoindentation," Macromolecules (in press), 2007. Saxena, S., Y. Hua, C. L. Henderson, and W. P King. "Nanoscale Thermal Lithography by Local Polymer Decomposition Using a Heated Atomic Force Microscope Cantilever Tip ," Journal of Microlithography, Microfabrication, and Microsystems, 2007. zoszkiewicz, R., T. Okada, S. C. Jones, T.-D. Li, W. P. King, S. R. Marder, and E. Riedo. "High-Speed, Thermochemical Nanolithography with Sub-15 nm Resolution," Nano Letters, 2007. Wornyo, E., K. Gall, F. Yang, and W. P. King. "Nanoindentation of Shape Memory Polymer Networks," Polymer, 48, 3213-3225, 2007. Yang, F., E. Wornyo, K. Gall, and W. P. King. "Nanoscale Strain Storage in a Shape Memory Polymer using a Heated Probe Tip," Nanotechnology, 18, 285302, 2007. Yang, F., E. Wornyo, K. Gall, and W. P. King. "Thermal Formation and Recovery of Nanoindents in a Shape Memory Polymer Studied using a Heated Tip," Scanning (in press), 2007. Allen, A., E. O. Sunden, A. Cannon, S. Graham, and W. P. King. "Nanomaterial Transfer using Hot Embossing for Flexible Electronic Devices," Applied Physics Letters (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 13:9, 2006), 88, 83112, 2006. Bakbak, S., P. K. Leech, B. E. Carson, S. Saxena, W. P. King, and U. H. F. Bunz. "1,3-Dioolar Cycloaddition for the Generation of Nanostructured Semiconductors by Heated Probe Tips," Macromolecules, 39, 6793-6795, 2006. Cannon, A. H., A. C. Allen, S. Graham, and W. P. King. "Molding Ceramic Microstructures on Flat and Curved Surfaces with and without Embedded Carbon Nanotubes," Journal of Micromechanics and Microengineering, 16, 2254-2563, 2006. King, W. P., S. Saxena, B. A. Nelson, and B. Weeks. "Nanoscale Thermal Analysis of an Energetic Material," Nano Letters, 6, 2145-2149, 2006. Lee, J., T. L. Wright, T. Beecham, B. A. Nelson, S. Graham, W. P. King. "Electrical, Thermal, and Mechanical Characterization of Heated Microcantilevers," Journal of Microelectromechanical Systems , 15, 1644-1645, 2006. Sunden, E. O., J. Lee, T. L. Wright, W. P. King, and S. Graham. "Room Temperature Chemical Vapor Deposition and Mass Detection on a Heated Atomic Force Microscope Cantilever," Applied Physics Letters (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 13:3, 2006), 88, 33107, 2006. Masters, N., W. Ye, and W. P. King. "The Impact of Sub-Continuum Gas Conduction on the Sensitivity of Heated Atomic Force Microscope Cantilevers," Physics of Fluids (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 12: 16, 2005), 17, 100615, 2005. Van Assche, G., Ghanem, A., Lhost, O., Van Mele, B., “Through-thickness analysis of the skin layer thickness of multi-layered biaxially-oriented polypropylene films by micro-thermal analysis” Polymer 46 (2005) 7132–7139 King, W. P., T. W. Kenny, and K. E. Goodson. "Comparison of Thermal and Piezoresistive Sensing Approaches for Atomic Force Microscopy Topography Measurements," Applied Physics Letters, 25, 2086-2088, 2004. Poggi, M. A., E. D. Gadsby, L. A. Bottomley, W. P. King, E. Oroudjev, and H. Hansma. "Scanning Probe Microscopy," Analytical Chemistry, 76, 3432-3446, 2004 an Assche, G., Van Mele, B., "Interphase formation in model composites studied by micro-thermal analysis," Polymer 43 (2002) 4605–4610 "A high-resolution multiple analysis approach using near-field thermal probes", A Hammiche, M Reading, D Grandy, D M Price, M J German, L Bozec, J M R Weaver, P Stopford, G Mills and H M Pollock, in: "Scanning tunnelling microscopy / spectroscopy and related techniques: 12th int. conf.", ed. P M Koenraad and M Kemerink (American Institute of Physics conf. Proc. 696, Melville, USA), pp. 369-376 (2003). R Smallwood, P Metherall, D Hose, M Delves, H Pollock, A Hammiche, C Hodges, V Mathot and P Willcocks, "Tomographic imaging and scanning thermal microscopy: thermal impedance tomography", Thermochimica Acta 385, 19-32 (2002). (Topical review): Micro-thermal analysis: techniques and applications, H. M. Pollock and A. Hammiche, J Phys D: Appl Phys 34, R23-R53 (2001). Micro-thermal analysis and evolved gas analysis, D M Price, M Reading, T J Lever, A Hammiche and H M Pollock, Thermochimica Acta 367-8, 195-202 (2001), corrected in 376 (2001) 95-97. Micro-thermal analysis of polymers: current capabilities and future prospects, M. Reading, D. M. Price, D B Grandy, R M Smith, L Bozec, M Conroy, A. Hammiche & H. M. Pollock, Macromolecular Symposia 167, 45-62 (2001). Micro-Thermal Analysis: scanning thermal microscopy and localised thermal analysis, D. M. Price, M. Reading, A. Hammiche & H. M. Pollock, International Journal of Pharmaceutics 192, 85-96 (1999). `Localised thermal analysis of a packaging filmA’, Price, D.M.; Reading, M.; Hammiche, A.; Pollock, H. M.; Branch, M. G.; Thermochimica Acta 332, 143-9 (1999). Two new microscopical variants of thermomechanical modulation for microscopy: SThEM and Dynamic L-TMA (scanning thermal expansion microscopy and dynamic localised thermomechanical analysis), A Hammiche, D M Price, E Dupas, G Mills, A Kulik, M Reading, J M R Weaver, H M Pollock, J Microscopy 199(3), 180-190 (2000). Highly localised thermal, mechanical and spectroscopic characterisation of polymers using miniaturised thermal probes, A Hammiche, L Bozec, M Conroy, H M Pollock, G Mills, J M R Weaver, D M Price, M Reading, D J Hourston and M Song, Journal of Vacuum Science & Technology B 18(3), 1322-1332 (2000). Localised evolved gas analysis by micro-thermal analysis, D. M. Price. M. Reading, R. M. Smith, H M Pollock and A Hammiche, J Thermal Analysis and Calorimetry 64, 309-314 (2001). 11. New adventures in thermal analysis, D M Price, M Reading, A Hammiche and H M Pollock, Journal of Thermal Analysis & Calorimetry 60, 723-733 (2000). b. Non Peer-reviewed: 1. “Heated tip-AFM: Applications in Nanocomposite Membranes and Energetic Materials” Microscopy Today, Dec 2006 (pdf format) 2. “nano-TA provides complementary information to Raman Spectroscopy”, Microscopy & Microanalysis SPM Supplement, Mar 2007 (pdf format) 3. “Nanoscale Thermal property Characterization of Automotive Coatings”, Microscopy Today, Nov 2007 (pdf format) 4. “Localized Thermal Analysis- From the micro to the nano scale”, American Laboratory, Nov 2007 (pdf format) 5. "Thermal Property Mapping at the micro and nanoscale" Thermal News, April 2009 (pdf format)    © 2010 Anasys Instruments Corporation. All rights reserved.