True model free nanoscale IR absorption spectroscopy
• New High speed, high resolution, full spectra AFM-IR measurement
• 10nm chemical imaging spatial resolution with Tapping AFM-IR
• High speed, rich, interpretable IR spectra that directly correlates to FTIR
• Multi-functional nanoscale property mapping modes with full featured AFM
• "Anasys engineered” for productivity and reliability
New nanoIR2-FS with FASTspectra™ technology
The nanoIR2-FS is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system provides spectroscopic capabilities that provide excellent correlation to FTIR transmission spectra on a wide range of material types, enabling nanoscale FTIR measurement.
The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique Point Spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.
Spectral assignments: S = O sym. stretch:1152,1295, CSO2C asym. stretch: 1320, C-O asym. stretch: 1000-1240, Benzene ring stretch: 1485, 1578, Carbonyl: 1731
10nm chemical imaging spatial resolution with Tapping AFM-IR
AFM-IR spectra and IR imaging shows variation of IR signal at different sites.
Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity
Chemical analysis of semiconductor devices
nanoIR measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.
Interface analysis of composites
nanoIR measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.
Organic nanocontaminant on metal surface
Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm.
Microtomed toner particle
Toner particles are a complex mixture of multiple components, the nanoIR allows identification and localization of these components with nanoscale resolution.
Hydrocarbons in minerals
AFM topography (L) and IR absorption image (R) showing location of hydrocarbons as detected by the CH stretch absorption.
Thin polymer films
The resonance enhanced mode enables high quality measurements on very thin films. A 20 nm film on PMMA taken by the nanoIR
Correlated property mapping with nanoscale topographical, chemical, mechanical, electrical, and thermal analysis capabilities
Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
KPFM Image on Nanocomposite sample composed of graphene oxide and polymeric material
Tapping phase image of polymer nanocomposite
Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).
Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.
Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.
Latest advancements in nanoscale IR spectroscopy: Resolution, performance, and speed
VP of Product Development
“FASTSpectra™ provides high speed spectroscopy and extends the spectroscopic range of resonance enhanced AFM-IR”
The new Resonance Enhanced AFM-IR (REINS) mode measures thin samples sizes down to single monolayers at high spatial resolution. It delivers spectra data in seconds.
Extended range resonance enhanced source
Life science applications
Material sciences applications
Nanoscale IR spectroscopy (AFM-IR): Achieving molecular understanding of polymer systems
Dr. Greg Meyers
Core R&D, The Dow Chemical Company
“We find the AFM-IR to be a very powerful technology for characterizing structures at the nanoscale.”
The webinar overviews how Dow Chemical is using the nanoIR to provide a deeper understanding at the molecular level of polymer systems to observe chemical contrasts in polymeric materials.
AFM-IR technology and recent innovations
Special focus on AFM-IR application in polymer systems
Hybrid multi-layer polymer films
Review of AFM-IR spatial resolution
Applications: Polymers, life sciences, materials
AFM-IR done on a reverse osmosis membrane shows the chemical heterogeneity and the variations of IR signal at different points on the sample. AFM-IR done on a reverse osmosis membrane shows the chemical heterogeneity and the variations of IR signal at different points on the sample.
Applications: Polymeric films, blends, and membranes
High resolution AFM-IR images (left) identified sub-surface features and composition of polymers localized at the surface interface. Average profiling (right) is performed as a function of height or IR response down to the nm scale.