Setting a new standard for nanoscale IR spectroscopy and imaging
• One Platform for the highest IR spectral and spatial resolution
• Two complementary nanoscale IR techniques: s-SNOM; and AFM-IR
• Multiple nanoscale property mapping modes with full featured AFM
• “Anasys engineered” for productivity and reliability
The only nanoscale IR spectroscopy and imaging platform with both
s-SNOM point spectroscopy
Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds ten times faster than spatio-spectral imaging
Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (top right), with both amplitude and phase of scattered light from interferometric detection (top left). s-SNOM phase image of a defect on-resonance and off-resonance (bottom).
Anasys engineered for ease of use
New standard for s-SNOM ease of use, productivity and system flexibility with automater laser alignment and hot spot tracking
Wide range of s-SNOM applications including graphene and novel 2d materials with spatial resolution down to 10nm
Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) 3D view of Phase image. (center) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude.
s-SNOM measurements of purple membrane reveal distribution of protein within the lipid membrane. AFM height (left); s-SNOM phase image with IR source tuned to the amide I absorption band (center); s-SNOM phase image off-resonance (right).
Combine S-SNOM and AFM-IR to create remarkable new data
Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures.
By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained.
Khanikaev et al., Nat. Comm. 7, 12045 (‘16).
Principal Beamline Scientist at the IR spectromicroscopy beamline, Soleil Synchrotron
"The nanoIR2-s is a perfect tool for a multi-user center with a combination of Soft Matter and Condensed Matter research"
"We chose the nanoIR2-s for the Soleil Synchrotron since it is a perfect tool for a multi-user center like ours where we undertake research into a wide range of materials. The nanoIR2-s uniquely combines the complementary techniques of AFM-IR and s-SNOM. AFM-IR provides true, model-free nanoscale IR spectroscopy and is ideal for research on materials such as life sciences, polymer and organics. Additionally s-SNOM is a complementary technique that provides sub-20nm complex optical property imaging and is most suitable for materials like graphene, 2D materials and photonics.”
Professor Alexandre Dazzi, Dept of Physics, University Paris-Sud, and Dr. Ferenc Borondics, Principal Beamline Scientist with the nanoIR2-s nanoscale IR spectroscopy system, installed at the SIMS line at the Soleil Synchrotron, Saint Aubin, France
s-SNOM imaging of multi-layer nylon and PE sample
s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm-1 were observed for nylon. Subsequent s-SNOM imaging at 1640 cm-1 showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM
s-SNOM absorption (1692cm-1)
s-SNOM absorption (1640cm-1)
s-SNOM absorption (black) and reflection (blue) spectrum
Unique AFM capabilities
Correlated property mapping with nano-chemical nano-mechanics, nano-electrical, nano-thermal and topography
Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
Magnetic force microscopy of a magnetic tape
Tapping phase image of polymer nanocomposite
Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).
Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.
Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.