10nm spatial resolution chemical imaging and spectroscopy
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).
Cross-section through the graphene flake shows sub 10nm resolution optical property imaging.
s-SNOM provides nanoscale FTIR microscopy and optical property imaging
Scattering SNOM provides information about the complex optical properties of the nanoscale region of the sample under a metallized tip. Specifically, both the optical amplitude and phase of the scattered light can be measured.
With appropriate models, these measurements can estimate the complex optical constants (n, k) of the material. Additionally, the optical phase versus wavelength provides a good approximation to a conventional IR absorption spectrum usually grazing Incidence.
The s-SNOM technique works on a variety of materials, but the best signal to noise tends to be on harder materials with high reflectivity, high dielectric constants, and/or strong optical resonances.
Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.
Combine S-SNOM and AFM-IR to create remarkable new data
Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures.
By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained.
Khanikaev et al., Nat. Comm. 7, 12045 (‘16).
Extend your capabilities with visible s-SNOM imaging
Topography (left), AFM phase (center), and s-SNOM phase (right).
NanoIR2-s using s-SNOM mode with HeNe 633nm laser source & InGaAs detector
nanoIR2-s enables visible SNOM imaging capabilities with visible range diode laser
Easy change over of laser and detector to maximize measurement time
IR Scattering SNOM by Anasys Instruments.
Conventional s-SNOM technique has demonstrated high resolution imaging across a range of materials, but tends to be slow, difficult to use and requires significant experimental set up and an advanced user to achieve high quality data.
Anasys Instruments has revolutionized s-SNOM extending its high performance chemical imaging and spectroscopic capabilities while improving chemical imaging quality, measurement productivity and creating unique new capabilities for this exciting technology.
Unique new capabilities
10nm spatial resolution imaging of optical & chemical properties
Exclusive POINTspectroscopy technology providing both spectroscopy and imaging with a single laser source
High speeds spectroscopy >10X faster than conventional spatio-spectral imaging techniques. (pat. pending)
Computer controlled source interface module supports multiple sources, including tunable and broadband lasers and synchrotron beamlines
Modular and flexible optical design is readily adaptable to future experiments
s-SNOM point spectroscopy
Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds >10X faster than spatio-spectral imaging
Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (Figure 2), with both amplitude and phase of scattered light from interferometric detection (Figure 1). s-SNOM phase image of a defect on-resonance and off-resonance (Figure 3 and 4).
Eliminating the need for complex optical alignments
Patented adaptive beam steering and all reflective optics enables broad wavelength compatibility while eliminating realignment and refocusing at different wavelengths
Patented dynamic power control maintains optimal power and signal over broad range of sources, wavelengths and samples
Pre-mounted probes and motorized tip, sample and source alignment eliminates tedious steps in probe installation and re-optimization.