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10nm spatial resolution chemical imaging and spectroscopy


Graphene plasmonics
Surface plasmon polariton on a graphene wedge. s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).
Graphene flake
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Cross-section through the graphene flake shows sub 10nm resolution optical property imaging.


s-SNOM provides nanoscale FTIR microscopy and optical property imaging


Scattering SNOM provides information about the complex optical properties of the nanoscale region of the sample under a metallized tip. Specifically, both the optical amplitude and phase of the scattered light can be measured.

With appropriate models, these measurements can estimate the complex optical constants (n, k) of the material. Additionally, the optical phase versus wavelength provides a good approximation to a conventional IR absorption spectrum usually grazing Incidence.

The s-SNOM technique works on a variety of materials, but the best signal to noise tends to be on harder materials with high reflectivity, high dielectric constants, and/or strong optical resonances. pointspectroscopy-data-a
hBN phonon-polaritons
hBN phonon polaritons Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.


Combine S-SNOM and AFM-IR  to create remarkable new data


Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045

Applications brief: Experimental demonstration of the microscopic origin of circular dichroism in two-dimensional metamaterials
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Extend your capabilities with visible s-SNOM imaging


aurohmbic Topography (left), AFM phase (center), and s-SNOM phase (right). NanoIR2-s using s-SNOM mode with HeNe 633nm laser source & InGaAs detector

nanoIR2-s enables visible SNOM imaging capabilities with visible range diode laser



Easy change over of laser and detector to maximize measurement time



IR Scattering SNOM by Anasys Instruments.

nanoIR2-sConventional s-SNOM technique has demonstrated high resolution imaging across a range of materials, but tends to be slow, difficult to use and requires significant experimental set up and an advanced user to achieve high quality data.

Anasys Instruments has revolutionized s-SNOM extending its high performance chemical imaging and spectroscopic capabilities while improving chemical imaging quality, measurement productivity and creating unique new capabilities for this exciting technology.

Unique new capabilities
  • 10nm spatial resolution imaging of optical & chemical properties
  • Exclusive POINTspectroscopy technology providing both spectroscopy and imaging with a single laser source
  • High speeds spectroscopy >10X faster than conventional spatio-spectral imaging techniques. (pat. pending)
  • Computer controlled source interface module supports multiple sources, including tunable and broadband lasers and synchrotron beamlines
  • Modular and flexible optical design is readily adaptable to future experiments


s-SNOM point spectroscopy

Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds >10X faster than spatio-spectral imaging
Optical spectroscopy s-SNOM.
Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (Figure 2), with both amplitude and phase of scattered light from interferometric detection (Figure 1). s-SNOM phase image of a defect on-resonance and off-resonance (Figure 3 and 4).


Eliminating the need for complex optical alignments

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  • Patented adaptive beam steering and all reflective optics enables broad wavelength compatibility while eliminating realignment and refocusing at different wavelengths
  • Patented dynamic power control maintains optimal power and signal over broad range of sources, wavelengths and samples
  • Pre-mounted probes and motorized tip, sample and source alignment eliminates tedious steps in probe installation and re-optimization.


Webinar: Nano-imaging and IR spectroscopy
of novel quantum and photonic materials
using s-SNOM and AFM-IR

MarkusRaschke-1
Dr. Markus Raschke
Department of Physics and Department of Chemistry, JILA, University of Colorado
“The capability of s-SNOM delivers high spatial imaging information with precision.”

Webinar:Combining s-SNOM and
AFM-IR to provide complete
nanoscale IR analysis.

Craig Prater
Dr. Craig Prater
Chief Technology Officer
Anasys Instruments
“Click anywhere on the AFM image for a nanoscale infrared absorption spectrum.”


More Information
Learn more

- s-SNOM publications

- Compare AFM-IR and s-SNOM



"The nanoIR2-s is the perfect tool for users from both Soft Matter and Hard Matter research."
Dr. Ferenc Borondics
Principal Beamline Scientist at the
IR spectromicroscopy beamline, Soleil Synchrotron
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