COMPANY Management Team Scientific Advisors News Careers TECHNOLOGY nanoIR FAQ-nanoIR nano-TA HT-AFM PRODUCTS nanoIR nano-TA2 SThM VESTA Probes APPLICATIONS nanoscale IR Spectroscopy nanoscale Thermal Analysis SUPPORT Applications Lab Manual Technical Notes Released Software EVENTS Conferences and Tradeshows Webinars CONTACT Request Information Sales Contacts Location Products     nanoIR     nano-TA2     SThM     VESTA     Probes The VESTA is the world’s first “point and click” instrument for localized thermal analysis and Transition Temperature Microscopy . This R&D100 Award winning technology uses a nanoscale thermal probe to locally heat samples to measure and map thermal transition temperatures and other thermal properties. Transition Temperature Microscopy gives critical information on samples from the scale of millimeters to nanometers and provides information that is not obtainable by any other technique. Easy to learn and operate, the VESTA allows you to move beyond bulk thermal anaysis to see the critical information you’ve been missing. Click here to learn more on the Applications of the VESTA and Transition Temperature Microscopy (TTM) Localized Thermal Analysis (LTA) The sample is heated locally with a thermal probe and the localized thermal transition temperature is measured via thermo mechanical analysis (TMA). This is shown below in Fig 1 where the plot shown is the physical deflection of the thermal probe versus its temperature. Point and Click Operation VESTA is easy to use. Locate a region of interest on the video microscope image and then click to Insert picture from Brochure start a local thermal analysis. Measurement data appears in seconds. You can even program an array of points for automatic and unattended operation. Transition Temperature Microscopy (TTM) A TTM Image is obtained by plotting the localized tansition temperatures at diferent points on the sample. You simply select the region on your optical microscope image on which you’d like a TTM image and the VESTA automatically proceeds to create the image. This powerful new form of microscopy enables you to identify localized thermal inhomogeneities on the sample surface that cannot be identifed by conventional forms of microscopy and bulk thermal analysis. Click here for more information    © 2010 Anasys Instruments Corporation. All rights reserved.