afm+, a new AFM platform from Anasys for analytical measurements

(November 30, 2011, Santa Barbara, CA) — Anasys Instruments, the company that pioneered nanoscale thermal analysis and nanoscale IR spectroscopy using an AFM, has chosen the Fall 2011 MRS meeting to introduce a brand new, easy-to-use research and analysis tool. The afm+ is the first fully integrated AFM platform to offer three important analytical capabilities. Using Anasys’ proprietary thermal probe technology for Nanoscale Thermal Analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample or to obtain a transition temperature map. It makes measurement of glass transition temperatures (Tg) and melting temperatures (Tm) a simple operation. This mode also includes Scanning Thermal Microscopy (SThM) which allows the user to map relative thermal conductivity and relative temperature differences across the sample.

Transition temperature microscopy (TTM™) is used to quantify and map thermal transitions in heterogeneous materials. Transition temperature microscopy (TTM) is a fully automated mode in which an array of nano-TA measurements is rapidly performed and each temperature ramp is automatically analyzed to determine the transition temperature.
Finally, the afm+ is fully upgradeable to perform nanoscale infrared spectroscopy for measuring and mapping chemical composition on the nanoscale. This technology enables point-and-click nanoscale IR spectroscopy that produces IR spectra that correlate to FTIR libraries. This makes chemical imaging on the nanoscale a reality.
The upgrade options also include the ability to measure the mechanical properties of samples. Data may be collected using a contact resonance method to map stiffness variations simultaneously with the topography.

In summary, the afm+ is providing the basis for a multifunctional nanoscale measurement suite. The afm+ is fully upgradeable to the Anasys nanoIR system, a probe-based measurement tool that utilizes infrared spectroscopy to reveal chemical composition at the nanoscale. The nanoIR also provides high-resolution characterization of local topographic, mechanical, and thermal properties. Potential application areas span the realms of polymer science, materials science, and life science, including detailed studies of structure-property correlations.
For further details, please visit

afm+ Product Picture

For further information:

Anasys contact:
Roshan Shetty
Anasys Instruments Corporation
121 Gray Avenue, Suite 100
Santa Barbara
CA 93101 USA
Tel: +1 (805) 730-3310
[email protected]

Media Contact:
Jezz Leckenby
Talking Science Limited
39 de Bohun Court
Saffron Walden
Essex CB10 2BA, UK
Tel +44 (0) 1799 521881
Mob +44 (0) 7843 012997
[email protected]