(May 6, 2015 Santa Barbara, CA) – Anasys Instruments, the pioneer in commercializing near-field infrared spectroscopy instrumentation, including AFM-IR, is pleased to direct readers to an in-depth review of AFM-IR technology published as a Focal Point article in the Journal of Applied Spectroscopy titled “AFM‐IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization.” Originally appearing in the December 2012 issue, this article has remained among the top downloaded papers as tracked on the Journal’s website. This high and sustained level of interest reflects the scientific community’s demand for molecular spectroscopic data at high spatial resolution to characterize the nature of nanoscale domains that so frequently influence the function and performance of synthetic and biological materials. The review paper on AFM-IR is available to download through the Society for Applied Spectroscopy website, at http://asp.sagepub.com/content/68/5/564.abstract.
AFM-IR moves infrared microscopy and chemical imaging into a spatial resolution regime well past the diffraction limit of both conventional infrared and Raman microscopes through use of an integrated atomic force microscope as a near-field detector. On thin films, sub-50 nm resolution has been achieved. Anasys Instruments has recently advanced AFM-IR technology by introducing the nanoIR2™ spectrometer with an infrared epi-illumination configuration (infrared beam illuminates the top side of the sample), providing even more flexibility in sample preparation. Studies of advanced polymer systems, composites and biophysical specimens are now conducted routinely with the nanoIR2. To learn more about the nanoIR2, and nanoscale spectroscopy applications, view the details at www.anasysinstruments.com/ir2-brochure.