Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image showing homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude showing strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase showing a difference phase with alternating layer thicknesses. Images (b) and (c) show the changing wavelengths of the SPhP across the layers.
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. 3D view phase image (left), s-SNOM phase image (center) with a line cross-section of the SPP standing wave, and s-SNOM amplitude image (right).
Combine S-SNOM and AFM-IR to create remarkable new data
Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures.
By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained.
Khanikaev et al., Nat. Comm. 7, 12045 (‘16).
nanoIR2s provides s-SNOM amplitude (bottom), s-SNOM phase (top) NanoIR2-s using s-SNOM mode with POINTspectra CW QCL laser source
Organolead triiodide perovskites
AFM-IR spectra and images of a solution-processed CH3NH3PbI3 photodetector collected as deposited (c,d) and after annealing at 140° C (e,f). Height images (top row) and corresponding AFM-IR images (bottom row). Images courtesy of Dong, R., Fang, et al, (2015), Adv. Mater., 27: 1912–1918
nano FTIR spectroscopy
Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US
s-SNOM imaging of multi-layer nylon and PE sample
s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm-1 were observed for nylon. Subsequent s-SNOM imaging at 1640 cm-1 showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM
s-SNOM absorption (1692cm-1)
s-SNOM absorption (1640cm-1)
s-SNOM absorption (black) and reflection (blue) spectrum