Breakthrough nanoscale IR spectroscopy platform that combines AFM-IR and sSNOM

(July 16, 2015 Santa Barbara, CA) – homePageSlide-nanoIR2sNew product from Anasys Instruments provides both robust nanoscale IR absorption spectroscopy via AFM-IR and sub-20nm complex optical property imaging via sSNOM

Anasys Instruments, the world leader in nanoscale IR spectroscopy, is pleased to announce the nanoIR2-s™ nanoscale spectroscopy and imaging platform. The nanoIR2-s™ brings together two powerful techniques, AFM-IR and s-SNOM (scattering scanning near field optical microscopy). The AFM-IR is a proprietary Anasys technique that measures nanoscale IR absorption by using the AFM probe tip as a detector of IR absorption. Anasys Instruments’ AFM-IR technology is now routinely applied by industrial and academic researchers to study advanced polymers and life science specimens through direct IR absorption spectra at a spatial resolution unconstrained by optical diffraction limits of conventional infrared and Raman microscopy. Applications include polymer interface chemistry, subcellular imaging, protein secondary structure of single fibrils, and many more.

The s-SNOM is a well-established technique in the AFM field for sub-20nm optical imaging by studying the scattered light from a region of the sample under the AFM probe. The s-SNOM technique has recently been extended to the infrared and can provide complex optical property imaging of diverse materials, especially inorganics, 2D materials, micro/nanoelectronic devices, nano-antennas, and plasmonic structures.

Anasys CTO, Dr. Craig Prater notes, “We are very proud to introduce the nanoIR2-s to expand the range of measurements and materials that can be supported by our instruments. Our customers demand the ability to measure IR absorption spectra with high accuracy and correlatable to FTIR spectra, as provided by our AFMIR technique. Additionally, they want to measure a broad range of materials, organics and inorganics, and to be able to choose the technique that works best for their material, without compromise.”

With several patented features, our nanoIR2-s delivers research productivity by providing adaptive beam steering, dynamic power control, and suppression of unwanted background to get fast, repeatable results. Our unique nano-thermal and nano-mechanical analysis capabilities, together with a robust AFM, make the nanoIR2s a multi-functional material property measurement platform.

To view the details or download a brochure, visit