(July 14, 2015 Santa Barbara, CA) – AFM-IR is a breakthrough new technique, commercialized by Anasys Instruments, that uses an Atomic Force Microscopy (AFM) probe as an infrared (IR) absorption sensor to obtain over 100X breakthrough in spatial resolution of IR Spectroscopy. Dr. Gregory Meyers, a Fellow at The Dow Chemical Company, has been involved in the technology development of the AFM-IR and is generally considered one of the world’s leading industrial AFM practitioners.
Dr. Meyers will present Dow results on the AFM-IR on a variety of samples including polymer blends and multilayer films. The title of the talk is “Nanoscale Molecular Imaging in Polymer Systems” and is co-authored by M.A. Rickard, C. W. Reinhardt, and J. J. Stanley. According to Dr. Meyers, “The AFM-IR solves a longstanding need in polymeric materials development for chemical analysis at the nanoscale. By doing it with an AFM, it simultaneously addresses one of the most important missing capabilities of the scanning probe microscopy platform – lack of chemical specificity, thus enabling the further growth of the AFM technique in new applications and markets. We are now able to see “the chemistry in the morphology.”
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