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<10nm spatial resolution
The new patented Tapping AFM-IR mode is an exciting new capability that provides 10 nm spatial resolution for chemical imaging along with monolayer measurement sensitivity and extends the capability of nanoIR to a broader range of samples. Tapping AFM-IR retains the ease of use of nanoIR technology, so optimum measurement resolution is achieved easily and quickly.
Chemical characterization of PS-P2VP block co-polymer sample by Tapping AFM-IR. (a) Tapping AFM height image. (b) Tapping AFM-IR spectra clearly identifying each chemical component. (c) Tapping AFM-IR overlay image highlighting both components ([email protected] 1492 and [email protected] 1588). (d) Profile cross section highlighting the achievable spatial resolution, 10 nm.
Sample courtesy of Dr. Gilles Pecastaings and Antoine Segolene at University of Bordeaux
LCR composite image made by overlying the LCR amplitudes collected at three different contact resonances. These resonances were selected to highlight the varying ratios of the lignin and cellulose which compose the sample.