Full featured atomic force microscope with powerful analytical capabilities

  • High resolution imaging
  • Unique quantitative mechanical property mapping
  • Nanoscale thermal analysis and SThM
  • All standard electrical and mechanical Imaging modes
  • Easiest to use AFM with fast time to data even for novice users


afm+ quantitative property mapping capabilities

Mechanical property mapping

Nanoscale thermal analysis

Upgradeable analytical capabilities

"I use the nano-TA technique routinely and have found it to be very useful in applications where interfacial properties are difficult to access, such as for weathering, thin films or multilayer systems where DSC can only provide average thermal properties and cannot differentiate the surface or particulate from the matrix."
Dr. L.T. Germinario
Eastman Chemical
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