• True model free nanoscale IR absorption spectroscopy
  • 10nm resolution chemical imaging with Tapping AFM-IR
  • FAST spectra AFM-IR provides high resolution, nanoIR spectroscopy in seconds
  • Rich, interpretable IR spectra that directly correlates to FTIR
  • Correlative microscopy with nanoscale property mapping and full featured AFM
  • "Anasys engineered” for Ease of Use, productivity and reliability




New nanoIR2-FS with FASTspectra technology

The nanoIR2-FS is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique Point Spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

Polyethersulphone (PES)
polyethersulfone-ir2-fspage-data-2
Spectral assignments: S = O sym. stretch:1152,1295, CSO2C asym. stretch: 1320, C-O asym. stretch: 1000-1240, Benzene ring stretch: 1485, 1578, Carbonyl: 1731


10nm chemical imaging spatial resolution with Tapping AFM-IR

nonoir2-illustration-12-16
3rd generation Resonance enhanced AFM-IR provides monolayer sensitivity
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Reverse osmosis membrane
reverse osmosis membrane AFM-IR spectra and IR imaging shows variation of IR signal at different sites.


Gerald Poirier

Manager, Advanced Materials Characterization Laboratory
University of Delaware
quote-poirier

"The nanoIR2 is a go-to tool for unique nanoscale IR analysis, and has solved many problems to the delight of our academic and industrial users."
"The University of Delaware purchased the nanoIR2 in a multiuser facility which I manage. Once the instrument was available to my users, it became a go to tool for unique IR analysis. The nanoIR2 has proved to be a very robust platform with great stand-alone AFM capabilities. The user interface is clear and very intuitive, and the software never crashes. Many problems in manufacturing and failure analysis have been solved or identified to the delight of my industrial users. I look forward to many more years of satisfying use of the Anasys nanoIR2".
13 mol% PHBHx

Tapping AFM-IR images show lenticular crystals; overall thickness (50 nm) indicates multilayer crystals. Characteristic IR absorption band of PHBHx. The band shape between 1700-1760 cm-1 reveals fairly similar crystallinity at different sites. An absorption band at 1510 cm-1 is also observed, indicating presence of aromatic moiety, not observed for 3.9 mol% sample.
Data courtesy of Rabolt et. al, University of Delaware


AFM-IR applications

Wide range of AFM-IR applications with spatial resolution down to 25nm and <10nm sensitivity





Correlated property mapping with nanoscale topographical, chemical, mechanical, electrical, and thermal analysis capabilities

Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.

afmapplications-2
Tapping image of block copolymer
Force modulation of polymer blend
KPFM Image on Nanocomposite sample composed of graphene oxide and polymeric material
Tapping phase image of polymer nanocomposite


Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
mechanicalApplications

Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps
on complex polymer blends (center) and high performance paper products (right).



Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.
nanoTAApplications

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.



Latest advancements in nanoscale IR spectroscopy: Resolution, performance, and speed

Kevin Kjoller
Kevin Kjoller
VP of Product Development
Anasys Instruments
FASTSpectra provides high speed spectroscopy and extends the spectroscopic range of resonance enhanced AFM-IR
The new Resonance Enhanced AFM-IR (REINS) mode measures thin samples sizes down to single monolayers at high spatial resolution. It delivers spectra data in seconds.
Webinar topics:
  • FastSpectra™ technology
  • Extended range resonance enhanced source
  • Quantitative AFM-IR
  • Life science applications
  • Material sciences applications

Nanoscale IR spectroscopy (AFM-IR): Achieving molecular understanding of polymer systems

GregMeyers
Dr. Greg Meyers
Core R&D, The Dow Chemical Company
“We find the AFM-IR to be a very powerful technology for characterizing structures at the nanoscale.”
The webinar overviews how Dow Chemical is using the nanoIR to provide a deeper understanding at the molecular level of polymer systems to observe chemical contrasts in polymeric materials.
Webinar topics:
  • AFM-IR technology and recent innovations
  • Special focus on AFM-IR application in polymer systems
  • Hybrid multi-layer polymer films
  • Review of AFM-IR spatial resolution

Applications: Polymers, life sciences, materials
<span style=AFM-IR done on a reverse osmosis membrane shows the chemical heterogeneity and the variations of IR signal at different points on the sample. AFM-IR done on a reverse osmosis membrane shows the chemical heterogeneity and the variations of IR signal at different points on the sample.

Webinar preview
Applications: Polymeric films, blends, and membranes
High resolution AFM-IR images (left) identified sub-surface features and composition of polymers localized at the surface interface. Average profiling (right) is performed as a function of height or IR response down to the nm scale.High resolution AFM-IR images (left) identified sub-surface features and composition of polymers localized at the surface interface. Average profiling (right) is performed as a function of height or IR response down to the nm scale.


Webinar preview