Setting a new standard for nanoscale IR spectroscopy and imaging

One Platform for the highest IR spectral and spatial resolution
Two complementary nanoscale IR techniques: s-SNOM; and AFM-IR
Multiple nanoscale property mapping modes with full featured AFM
“Anasys engineered” for productivity and reliability
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The only nanoscale IR spectroscopy and imaging platform with both


Highest performance nano FTIR spectroscopy

  • Highest performance IR SNOM spectroscopy with the most advanced nanoIR laser source available
  • nano FTIR spectroscopy with integrated DFG, continuum based laser source
  • Broadband synchrotron light source integration
  • Multi-chip QCL laser source for spectroscopy and chemical imaging
Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US

s-SNOM point spectroscopy

Exclusive technology enables rapid spectroscopy and imaging with a single tunable laser source at speeds ten times faster than spatio-spectral imaging

Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (top right), with both  amplitude and phase of scattered light from  interferometric detection (top left). s-SNOM phase image of a defect  on-resonance and  off-resonance (bottom). Optical spectroscopy and imaging with s-SNOM. Point spectrum of s-SNOM gives complex optical property of the sample (top right), with both amplitude and phase of scattered light from interferometric detection (top left). s-SNOM phase image of a defect on-resonance and off-resonance (bottom).

Anasys engineered for ease of use

New standard for s-SNOM ease of use, productivity and system flexibility with automater laser alignment and hot spot tracking

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s-SNOM applications

Wide range of s-SNOM applications including graphene and novel 2d materials with spatial resolution down to 10nm

Combine S-SNOM and AFM-IR  to create remarkable new data

Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045

Applications brief: Experimental demonstration of the microscopic origin of circular dichroism in two-dimensional metamaterials

Dr. Ferenc Borondics

Principal Beamline Scientist at the IR spectromicroscopy beamline, Soleil Synchrotron

"The nanoIR2-s is a perfect tool for a multi-user center with a combination of Soft Matter and Condensed Matter research"
"We chose the nanoIR2-s for the Soleil Synchrotron since it is a perfect tool for a multi-user center like ours where we undertake research into a wide range of materials. The nanoIR2-s uniquely combines the complementary techniques of AFM-IR and s-SNOM. AFM-IR provides true, model-free nanoscale IR spectroscopy and is ideal for research on materials such as life sciences, polymer and organics. Additionally s-SNOM is a complementary technique that provides sub-20nm complex optical property imaging and is most suitable for materials like graphene, 2D materials and photonics.”
Professor Alexandre Dazzi, Dept of Physics, University Paris-Sud, and Dr. Ferenc Borondics, Principal Beamline Scientist with the nanoIR2-s nanoscale IR spectroscopy system, installed at the SIMS line at the Soleil Synchrotron, Saint Aubin, France

s-SNOM imaging of multi-layer nylon and PE sample

s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm-1 were observed for nylon. Subsequent s-SNOM imaging at 1640 cm-1 showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM

AFM height
s-SNOM absorption
s-SNOM absorption
s-SNOM absorption (black) and reflection (blue) spectrum

Unique AFM capabilities

Correlated property mapping with nano-chemical nano-mechanics, nano-electrical, nano-thermal and topography

Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
Magnetic force microscopy of a magnetic tape
Tapping phase image of polymer nanocomposite

Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.


Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps
on complex polymer blends (center) and high performance paper products (right).

Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.