Setting a new standard for nanoscale IR spectroscopy and imaging

  • Two complementary nanoscale IR techniques – s-SNOM and AFM-IR
  • 10nm resolution chemical and optical property mapping
  • nano FTIR high performance broadband spectroscopy
  • Correlative microscopy with nanoscale property mapping and full featured AFM
  • “Anasys Engineered” for ease of use, productivity and reliability

10nm spatial resolution chemical imaging and spectroscopy

Graphene plasmonics
Surface plasmon polariton on a graphene wedge. s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).
High resolution property mapping
Cross-section through the graphene flake shows sub 10nm resolution optical property imaging.

Highest performance nano FTIR spectroscopy

  • Highest performance IR SNOM spectroscopy with the most advanced nanoIR laser source available
  • nano FTIR spectroscopy with integrated DFG, continuum based laser source
  • Broadband synchrotron light source integration
  • Multi-chip QCL laser source for spectroscopy and chemical imaging
Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US

POINTspectra technology
POINTspectra lasers enable both spectroscopy and high resolution optical property mapping across a broad range of wavelengths.
  1. Select feature to be measured in the AFM image
  2. Measure spectroscopy of sample and select wavelength of interest
  3. Create high resolution optical property map
10nm spatial resolution images of amplitude and phase are rapidly measured from interferograms over a range of wavelengths

Enables 10nm resolution Tapping AFM-IR for complementary, unique IR spectroscopy

Anasys engineered for ease of use

New standard for s-SNOM ease of use, productivity and system flexibility with automated laser alignment and hot spot tracking

s-SNOM applications

Wide range of s-SNOM applications including graphene and novel 2d materials with spatial resolution down to 10nm

Combine S-SNOM and AFM-IR  to create remarkable new data

Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045

Applications brief: Experimental demonstration of the microscopic origin of circular dichroism in 2D metamaterials
2D metamaterials

Dr. Ferenc Borondics

Principal Beamline Scientist at the IR spectromicroscopy beamline, Soleil Synchrotron

"The nanoIR2-s is a perfect tool for a multi-user center with a combination of Soft Matter and Condensed Matter research"
"We chose the nanoIR2-s for the Soleil Synchrotron since it is a perfect tool for a multi-user center like ours where we undertake research into a wide range of materials. The nanoIR2-s uniquely combines the complementary techniques of AFM-IR and s-SNOM. AFM-IR provides true, model-free nanoscale IR spectroscopy and is ideal for research on materials such as life sciences, polymer and organics. Additionally s-SNOM is a complementary technique that provides sub-20nm complex optical property imaging and is most suitable for materials like graphene, 2D materials and photonics.”
Professor Alexandre Dazzi, Dept of Physics, University Paris-Sud, and Dr. Ferenc Borondics, Principal Beamline Scientist with the nanoIR2-s nanoscale IR spectroscopy system, installed at the SIMS line at the Soleil Synchrotron, Saint Aubin, France

nanoIR2-s extend beyond nanoIR to visible and THz and synchrotron beam

  • nanoIR2-s enables visible SNOM imaging
  • System supports THz imaging and spectroscopy
  • Special design available for use in synchrotron
  • Easy change over of laser set up to maximize measurement time
  • Simple swap out of optics components and detectors
s-SNOM phase
Visible imaging with s-SNOM using 633nm HeNe laser

Unique AFM capabilities

Correlated property mapping with nano-chemical nano-mechanics, nano-electrical, nano-thermal and topography

Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
KPFM image: Nanocomposite of graphene oxide and polymeric material
Tapping phase image of polymer nanocomposite

Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.


Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps
on complex polymer blends (center) and high performance paper products (right).

Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.

Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.