Setting a new standard for nanoscale IR spectroscopy and imaging
Two complementary nanoscale IR techniques – s-SNOM and AFM-IR
10nm resolution chemical and optical property mapping
nano FTIR high performance broadband spectroscopy
Correlative microscopy with nanoscale property mapping and full featured AFM
“Anasys Engineered” for ease of use, productivity and reliability
10nm spatial resolution chemical imaging and spectroscopy
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).
High resolution property mapping
Cross-section through the graphene flake shows sub 10nm resolution optical property imaging.
Highest performance nano FTIR spectroscopy
Highest performance IR SNOM spectroscopy with the most advanced nanoIR laser source available
nano FTIR spectroscopy with integrated DFG, continuum based laser source
Broadband synchrotron light source integration
Multi-chip QCL laser source for spectroscopy and chemical imaging
Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US
POINTspectra technology POINTspectra lasers enable both spectroscopy and high resolution optical property mapping across a broad range of wavelengths.
Select feature to be measured in the AFM image
Measure spectroscopy of sample and select wavelength of interest
Create high resolution optical property map
10nm spatial resolution images of amplitude and phase are rapidly measured from interferograms over a range of wavelengths
Enables 10nm resolution Tapping AFM-IR for complementary, unique IR spectroscopy
Anasys engineered for ease of use
New standard for s-SNOM ease of use, productivity and system flexibility with automated laser alignment and hot spot tracking
Wide range of s-SNOM applications including graphene and novel 2d materials with spatial resolution down to 10nm
Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN). (a) AFM height image shows homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude shows strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase shows a difference phase with layer thickness. From the image b and c, we can also see the wavelength of the SPhP changes with the number of layers.
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) 3D view of Phase image. (center) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude.
s-SNOM measurements of purple membrane reveal distribution of protein within the lipid membrane. AFM height (left); s-SNOM phase image with IR source tuned to the amide I absorption band (center); s-SNOM phase image off-resonance (right).
Combine S-SNOM and AFM-IR to create remarkable new data
Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045
Principal Beamline Scientist at the IR spectromicroscopy beamline, Soleil Synchrotron
"The nanoIR2-s is a perfect tool for a multi-user center with a combination of Soft Matter and Condensed Matter research"
"We chose the nanoIR2-s for the Soleil Synchrotron since it is a perfect tool for a multi-user center like ours where we undertake research into a wide range of materials. The nanoIR2-s uniquely combines the complementary techniques of AFM-IR and s-SNOM. AFM-IR provides true, model-free nanoscale IR spectroscopy and is ideal for research on materials such as life sciences, polymer and organics. Additionally s-SNOM is a complementary technique that provides sub-20nm complex optical property imaging and is most suitable for materials like graphene, 2D materials and photonics.”
Professor Alexandre Dazzi, Dept of Physics, University Paris-Sud, and Dr. Ferenc Borondics, Principal Beamline Scientist with the nanoIR2-s nanoscale IR spectroscopy system, installed at the SIMS line at the Soleil Synchrotron, Saint Aubin, France
nanoIR2-s extend beyond nanoIR to visible and THz and synchrotron beam
nanoIR2-s enables visible SNOM imaging
System supports THz imaging and spectroscopy
Special design available for use in synchrotron
Easy change over of laser set up to maximize measurement time
Simple swap out of optics components and detectors
Visible imaging with s-SNOM using 633nm HeNe laser
Unique AFM capabilities
Correlated property mapping with nano-chemical nano-mechanics, nano-electrical, nano-thermal and topography
Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
KPFM image: Nanocomposite of graphene oxide and polymeric material
Tapping phase image of polymer nanocomposite
Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).
Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.
Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.