New resonance enhanced mode enables nanoscale IR on <20nm films
Rich, interpretable IR spectra
Designed and built for productivity and rapid time-to-results
Multifunctional measurements including integrated thermal and mechanical property mapping
Powerful, full featured AFM
Wide range of AFM-IR applications with spatial resolution down to 10nm
Chemical analysis of semiconductor devices
nanoIR2 measurements on layers in a semiconductor device. The analysis reveals variations in chemical composition not measurable by conventional IR microscopy.
Interface analysis of composites
nanoIR2 measurements on a carbon fiber-epoxy composite revealing variations in chemical composition across the fiber/epoxy interface. This measurement was performed on a polished bulk sample.
Organic nanocontaminant on metal surface
Spectra collected using the resonant enhanced mode allows identification of nanoscale organic contamination on a magnetic disk. This particle has dimensions of approximately 100 nm x 200 nm x 28 nm.
Microtomed toner particle
Toner particles are a complex mixture of multiple components, the nanoIR2 allows identification and localization of these components with nanoscale resolution.
Hydrocarbons in minerals
AFM topography (L) and IR absorption image (R) showing location of hydrocarbons as detected by the CH stretch absorption.
Thin polymer films
The resonance enhanced mode enables high quality measurements on very thin films. A 20 nm film on PMMA taken by the nanoIR2
Correlated Property mapping with nano-chemical nano-mechanics, nano-electrical and nano-thermal and topography
Versatile, full featured AFM
Every product in the Anasys Instruments family is built around our full featured AFM supporting many routinely used AFM imaging modes. These include tapping, phase, contact, force curves, lateral force, force modulation, EFM, MFM, CAFM and more.
Tapping image of block copolymer
Force modulation of polymer blend
Magnetic force microscopy of a magnetic tape
Tapping phase image of polymer nanocomposite
Mechanical spectroscopy and imaging
Broadband nanomechanical spectra utilizing Lorentz Contact Resonance (LCR) provides rich information about variations in material stiffness, viscosity and friction. LCR provides sensitive material contrast on materials ranging from soft polymers to hard inorganics and semiconductors.
Nanomechanical spectra (left) discriminate materials on the basis of stiffness and damping. Examples of LCR stiffness maps on complex polymer blends (center) and high performance paper products (right).
Nanoscale thermal analysis (nanoTA)
Developed by Anasys Instruments, this award-winning technology uses Anasys ThermaLever™ probes to locally ramp the sample’s temperature to measure and map thermal transitions and other thermal properties.
Left: nanoTA uses a heated AFM tip to measure glass transition and melt temperatures with nanoscale spatial resolution. Middle: Thermal transition curves on a 21 layer laminated polymer film. Right: Scanning thermal microscopy visualizes variations in temperature and thermal conductivity on a sectioned circuit board.